Model-based clustering for integrated circuit yield enhancement
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Publication:857371
DOI10.1016/j.ejor.2005.11.032zbMath1109.90029OpenAlexW2035969035MaRDI QIDQ857371
Publication date: 14 December 2006
Published in: European Journal of Operational Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.ejor.2005.11.032
Stochastic models in economics (91B70) Reliability, availability, maintenance, inspection in operations research (90B25)
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