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On-chip electrostatically actuated bending tests for the mechanical characterization of polysilicon at the micro scale

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Publication:865134
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DOI10.1007/S11012-005-2135-9zbMath1146.74322OpenAlexW2022943710MaRDI QIDQ865134

Caterina Riva, Biagio De Masi, Fabrizio Cacchione, Alberto Corigliano

Publication date: 13 February 2007

Published in: Meccanica (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s11012-005-2135-9


zbMATH Keywords

mechanical propertiesMEMSWeibull statisticspolysilicon


Mathematics Subject Classification ID

Electromagnetic effects in solid mechanics (74F15)


Related Items (2)

On-chip electrostatically actuated bending tests for the mechanical characterization of polysilicon at the micro scale ⋮ Monte Carlo simulation of micro-cracking in polysilicon MEMS exposed to shocks




Cites Work

  • On-chip electrostatically actuated bending tests for the mechanical characterization of polysilicon at the micro scale




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