Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. I: Analysis for obtaining film stress from non-local curvature information

DOI10.1016/J.IJSOLSTR.2006.10.016zbMath1331.74014OpenAlexW2153502028MaRDI QIDQ869280

N. E. Zubov

Publication date: 2 March 2007

Published in: International Journal of Solids and Structures (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.ijsolstr.2006.10.016

zbMATH Keywords

thin filmsinterfacial shearsnon-uniform misfit strainnon-local stress-curvature relationsnon-uniform film thickness

Mathematics Subject Classification ID

Theory of constitutive functions in solid mechanics (74A20)

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