Single fault detection tests for generalized iterative switching circuits

DOI10.3103/S0278641915030073zbMath1357.94112OpenAlexW1561678540MaRDI QIDQ887392

Elena Yu. Romanova, Dmitry S. Romanov

Publication date: 26 October 2015

Published in: Moscow University Computational Mathematics and Cybernetics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.3103/s0278641915030073

zbMATH Keywords

switching circuitShannon functionfault detection testeasily testable circuitgeneralized iterative switching circuit

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Related Items (1)

Bounds on Shannon functions of lengths of contact closure tests for contact circuits

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