Defect detection using feature point matching for non-repetitive patterned images

DOI10.1007/S10044-012-0305-7zbMath1328.68275OpenAlexW2029021861MaRDI QIDQ903103

Hye Won Kim, Suk I. Yoo

Publication date: 5 January 2016

Published in: PAA. Pattern Analysis and Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10044-012-0305-7

zbMATH Keywords

computer visioninspectiondefect detectionfeature point matching

Mathematics Subject Classification ID

Computing methodologies for image processing (68U10) Machine vision and scene understanding (68T45)

Uses Software

• PCA-SIFT
• SIFT

Cites Work

• Unnamed Item
• Contrast context histogram. An efficient discriminating local descriptor for object recognition and image matching
• Defect detection in patterned wafers using multichannel scanning electron microscope
• Image Alignment and Stitching: A Tutorial
• The evaluation of normalized cross correlations for defect detection
• Handbook of Mathematical Models in Computer Vision

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