Hybrid variable finite elements for semiconductor devices

DOI10.1016/0898-1221(90)90138-AzbMath0705.65097OpenAlexW2081241459MaRDI QIDQ918175

Zhang-Xin Chen

Publication date: 1990

Published in: Computers \& Mathematics with Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/0898-1221(90)90138-a

zbMATH Keywords

Galerkin methoderror estimatesemiconductor deviceshybrid variable finite elements

Mathematics Subject Classification ID

PDEs in connection with optics and electromagnetic theory (35Q60) Error bounds for boundary value problems involving PDEs (65N15) Finite element, Rayleigh-Ritz and Galerkin methods for boundary value problems involving PDEs (65N30) Technical applications of optics and electromagnetic theory (78A55) Applications to the sciences (65Z05)

Related Items

Nonlinear boundary value problems with application to semiconductor device equations ⋮ Projection finite element methods for semiconductor device equations

Cites Work

• Generalized Finite Element Methods: Their Performance and Their Relation to Mixed Methods
• Two-Dimensional Exponential Fitting and Applications to Drift-Diffusion Models
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