Defect detection in periodically patterned surfaces using independent component analysis

DOI10.1016/J.PATCOG.2008.02.011zbMath1167.68438OpenAlexW1963970230MaRDI QIDQ937425

Du-Ming Tsai, Shia-Chih Lai

Publication date: 15 August 2008

Published in: Pattern Recognition (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.patcog.2008.02.011

zbMATH Keywords

independent component analysisparticle swarm optimizationdefect detectionliquid crystal displaypatterned surface

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10)

Uses Software

• FastICA

Cites Work

• Unnamed Item
• Independent component analysis, a new concept?
• Independent component analysis for texture segmentation.
• An independent component analysis-based filter design for defect detection in low-contrast surface images
• A theory for multiresolution signal decomposition: the wavelet representation
• The generalized Gabor scheme of image representation in biological and machine vision
• Independent component analysis applied to feature extraction from colour and stereo images
• Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition
• NONLINEAR SIGNAL CLASSIFICATION
• One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction

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