Residual-based localization and quantification of peaks in X-ray diffractograms

DOI10.1214/08-AOAS181zbMath1149.62102arXiv0711.3687OpenAlexW2099199824MaRDI QIDQ958320

D. Mergel, M. Meise, Ursula Gather, Laurie Davies, Thoralf Mildenberger

Publication date: 3 December 2008

Published in: The Annals of Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://arxiv.org/abs/0711.3687

zbMATH Keywords

nonparametric regressionconfidence regionspeak detectionX-ray diffractometrythin film physics

Mathematics Subject Classification ID

Nonparametric regression and quantile regression (62G08) Statistical mechanics of crystals (82D25) Applications of statistics to physics (62P35) Applications of statistical mechanics to specific types of physical systems (82D99)

Related Items

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Uses Software

• ftnonpar

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