Ellipsoidal decision regions for motif-based patterned fabric defect detection

DOI10.1016/J.PATCOG.2009.12.001zbMath1192.68599OpenAlexW2031577896MaRDI QIDQ962807

Nelson H. C. Yung, Grantham K. H. Pang, Henry Y. T. Ngan

Publication date: 7 April 2010

Published in: Pattern Recognition (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.patcog.2009.12.001

zbMATH Keywords

motifdefect detectionellipsoidal decision regionmax-min decision regionpatterned fabric

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10)

Related Items (3)

Fabric defect inspection based on isotropic lattice segmentation ⋮ Clustering ellipses for anomaly detection ⋮ Analysis of planar ornament patterns via motif asymmetry assumption and local connections

Cites Work

• Unnamed Item
• A visual approach for driver inattention detection
• High performance computing algorithms for textile quality control
• A study of Gaussian mixture models of color and texture features for image classification and segmentation
• Motif-based defect detection for patterned fabric
• The 17 plane symmetry groups

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