A new class of flat-top windows for exposure assessment in magnetic field measurements

DOI10.1016/J.SIGPRO.2007.02.012zbMath1186.94096OpenAlexW1970392717MaRDI QIDQ970979

R. Dib, C. A. Cortés, G. Rattá, E. Mombello

Publication date: 19 May 2010

Published in: Signal Processing (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.sigpro.2007.02.012

zbMATH Keywords

Fourier analysismagnetic fieldDFTwindowingEMF exposure assessmentflat-top windows

Mathematics Subject Classification ID

Signal theory (characterization, reconstruction, filtering, etc.) (94A12)

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