Adhesion dynamics in probing micro- and nanoscale thin solid films
type: Item
instance of: scholarly article
title: Adhesion dynamics in probing micro- and nanoscale thin solid films
zbMATH Open document ID: 1162.74398
DOI: 10.1155/2008/742569
published in: Mathematical Problems in Engineering
publication date: 2009-06-11T00:00:00Z
full work available at URL: https://eudml.org/doc/55478
review text: Summary: This study focuses on modeling the probe dynamics in scratching and indenting thin solid films at micro- and nanoscales. The model identifies bifurcation conditions that define the stick-slip oscillation patterns of the tip. It is found that the local energy fluctuations as a function of the inelastic deformation, defect formation, material properties, and contact parameters determine the oscillation behavior. The transient variation of the localized function makes the response nonlinear at the adhesion junction. By quantifying the relation between the bifurcation parameters and the oscillation behavior, this model gives a realistic representation of the complex adhesion dynamics. Specifically, the model establishes the link between the stick-slip behavior and the inelastic deformation and the local potentials. This model justifies the experimental observations and the molecular dynamics simulation of the adhesion and friction dynamics in both the micro- and nanoscale contact.
Mathematics Subject Classification ID: 74K35
zbMATH DE Number: 5564134
Wikidata QID: Q58646254
author: Xiao-Ling He
MaRDI profile type: Publication
OpenAlex ID: W2015740702
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description: scientific article; zbMATH DE number 5564134