Single test for closed contacts in block circuits
type: Item
instance of: scholarly article
title: Single test for closed contacts in block circuits
zbMATH Open document ID: 0629.94025
DOI: 10.1007/BF01137682
author: S. M. Vartanyan
published in: Mathematical Notes
publication date: 1987-01-01T00:00:00Z
review text: The problem of unique minimal closure test is studied for serial block schemes with contacts of the form \(B^{1,2}\), \(B^{2,2},\ldots, B^{2,2}\), \(B^{2,1}\) where \(B^{i,j}\) is a block having \(i\) inputs and \(j\) outputs. It is assumed that each block contains the contacts of a unique relay, all the relays are distinct and the blocks of a scheme are the simplest (regarding the number of contacts) representatives of equivalent block classes, the number of these classes being equal to 18. In theorems 1--3 lower and upper bounds of minimal test length are deduced for schemes having blocks belonging to some particular classes, and theorem 4 gives the order of minimal test length for any scheme of the assumed structure.
Mathematics Subject Classification ID: 94C12
zbMATH DE Number: 4025340
zbMATH Keywords: unique minimal closure test
zbMATH Keywords: minimal test length
reviewed by: Leon Livovschi
MaRDI profile type: Publication
cites work: Q5620541
description: scientific article; zbMATH DE number 4025340