Testing in two-dimensional iterative logic arrays
The test methods of two-dimensional (2-D) iterative logic arrays (ILAs) composed of combinational cells are considered. An ILA which can be tested by a test set whose size is a constant independent of the number of cells in the ILA is referred to as a C-testable ILA. An ILA which can be tested in a number of vectors linear to the number of cells is referred to as a linear testable ILA. The fault model assumed is that faults in a cell can change a cell behavior in any arbitrary way, as long as the cell remains a combinational circuit. At the array level, two fault-models are considered: in the single cell fault-model (SCFM) only one cell can be faulty; and in the multiple cell fault-model (MCFM) any number of cells can be faulty. Previous papers have shown the testing methods of C-testable and linear testable one-dimensional ILAs under SCFM and MCFM. In this paper, we extend those methods and use the concept of divide and conquer to generate test sets for 2-D ILAs under SCFM and MCFM. The sufficient conditions and test complexities are derived. Furthermore, some practical circuits are used for example.
scientific article; zbMATH DE number 4045660