Testing in two-dimensional iterative logic arrays
type: Item
instance of: scholarly article
title: Testing in two-dimensional iterative logic arrays
zbMATH Open document ID: 0641.94038
DOI: 10.1016/0898-1221(87)90074-5
author: W.-T. Cheng
author: J. H. Patel
publication date: 1987-01-01T00:00:00Z
review text: The test methods of two-dimensional (2-D) iterative logic arrays (ILAs) composed of combinational cells are considered. An ILA which can be tested by a test set whose size is a constant independent of the number of cells in the ILA is referred to as a C-testable ILA. An ILA which can be tested in a number of vectors linear to the number of cells is referred to as a linear testable ILA. The fault model assumed is that faults in a cell can change a cell behavior in any arbitrary way, as long as the cell remains a combinational circuit. At the array level, two fault-models are considered: in the single cell fault-model (SCFM) only one cell can be faulty; and in the multiple cell fault-model (MCFM) any number of cells can be faulty. Previous papers have shown the testing methods of C-testable and linear testable one-dimensional ILAs under SCFM and MCFM. In this paper, we extend those methods and use the concept of divide and conquer to generate test sets for 2-D ILAs under SCFM and MCFM. The sufficient conditions and test complexities are derived. Furthermore, some practical circuits are used for example.
Mathematics Subject Classification ID: 94C10
zbMATH DE Number: 4045660
zbMATH Keywords: two-dimensional iterative logic arrays
zbMATH Keywords: combinational cells
zbMATH Keywords: combinational circuit
zbMATH Keywords: single cell fault-model
zbMATH Keywords: multiple cell fault-model
MaRDI profile type: Publication
full work available at URL: 0898-1221(87)90074-5
OpenAlex ID: W1973527898
cites work: A Testable Design of Iterative Logic Arrays
cites work: Multiple Fault Detection in Arrays of Combinational Cells
cites work: Truth-Table Verification of an Iterative Logic Array
cites work: Testable Sequential Cellular Arrays
cites work: Q5579037
cites work: The Design of Easily Testable VLSI Array Multipliers
published in: Computers & Mathematics with Applications
description: scientific article; zbMATH DE number 4045660