Estimation of power-type acceleration functions in life testing
type: Item
instance of: scholarly article
title: Estimation of power-type acceleration functions in life testing
zbMATH Open document ID: 0661.62106
DOI: 10.1016/0895-7177(88)90084-2
author: H. Strelec
author: R. Viertl
published in: Mathematical and Computer Modelling
publication date: 1988-01-01T00:00:00Z
review text: The lifetime distribution of a certain device depends on the stress S under which it is operating. In many practical cases one can find a relation between the distribution functions \(F(S_ 1;t)\) and \(F(S_ 2;t)\) under considered stress levels \(S_ 1\) and \(S_ 2\) by a so-called acceleration function (AF) \(a(S_ 1,S_ 2;t)\) with \(F(S_ 2;t)=F(S_ 1;a(S_ 1,S_ 2;t))\), \(t>0\). A method for estimating an AF of power- type \(a(S_ 1,S_ 2;t)=\alpha (S_ 1,S_ 2)\cdot t^{\beta (S_ 1,S_ 2)}\) under multicomponent stress \(S=(s_ 1,...,s_ k)\) is discussed. The techniques are based on results described by the authors in earlier papers. An example shows the application of these methods for a plastic encapsulated IC.
Mathematics Subject Classification ID: 62N05
zbMATH DE Number: 4080709
zbMATH Keywords: lifetime distribution
zbMATH Keywords: stress levels
zbMATH Keywords: acceleration function
zbMATH Keywords: multicomponent stress
MaRDI profile type: Publication
full work available at URL: 0895-7177(88)90084-2
OpenAlex ID: W1971600364
cites work: Q3888406
cites work: A Nonparametric Approach to Accelerated Life Testing
cites work: Zur Theorie der Systeme gewöhnlicher Differentialgleichungen. II
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cites work: Q4107812
cites work: Inference from accelerated life tests using eyring type re-parameterizations
description: scientific article; zbMATH DE number 4080709