Optimal tests and estimators for truncated exponential families
type: Item
instance of: scholarly article
title: Optimal tests and estimators for truncated exponential families
zbMATH Open document ID: 0492.62024
DOI: 10.1007/BF01893370
author: M. A. Beg
published in: Metrika
publication date: 1982-01-01T00:00:00Z
full work available at URL: https://eudml.org/doc/175844
Mathematics Subject Classification ID: 62F10
Mathematics Subject Classification ID: 62F03
zbMATH DE Number: 3774696
zbMATH Keywords: truncated exponential families
zbMATH Keywords: Blackwell-Rao-Lehmann-Scheffe theory
zbMATH Keywords: minimum variance unbiased estimators
zbMATH Keywords: uniformly most powerful unbiased tests
MaRDI profile type: Publication
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description: scientific article; zbMATH DE number 3774696