Efficient VLSI fault simulation
type: Item
instance of: scholarly article
title: Efficient VLSI fault simulation
zbMATH Open document ID: 0760.94020
DOI: 10.1016/0898-1221(93)90219-L
publication date: 1993-02-22T00:00:00Z
Mathematics Subject Classification ID: 94C12
Mathematics Subject Classification ID: 94C10
zbMATH DE Number: 120316
zbMATH Keywords: fault simulation
zbMATH Keywords: acyclic Boolean circuit
zbMATH Keywords: test pattern
zbMATH Keywords: VLSI circuits
author: J. Reif
MaRDI profile type: Publication
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published in: Computers & Mathematics with Applications
description: scientific article; zbMATH DE number 120316