Bayesian analysis for masked system failure data using non-identical Weibull models
type: Item
instance of: scholarly article
title: Bayesian analysis for masked system failure data using non-identical Weibull models
zbMATH Open document ID: 1057.62532
DOI: 10.1016/S0378-3758(98)00218-3
author: Sanjib Basu
author: Asit P. Basu
author: Chiranjit Mukhopadhyay
published in: Journal of Statistical Planning and Inference
publication date: 1999-01-01T00:00:00Z
Mathematics Subject Classification ID: 62N05
Mathematics Subject Classification ID: 62F15
zbMATH DE Number: 1331397
zbMATH Keywords: Adaptive rejection
zbMATH Keywords: Competing risks
zbMATH Keywords: Gibbs sampling
zbMATH Keywords: Log-concave densities
zbMATH Keywords: Masking
zbMATH Keywords: Weibull distribution
MaRDI profile type: Publication
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full work available at URL: s0378-3758(98)00218-3
OpenAlex ID: W1975676394
description: scientific article; zbMATH DE number 1331397