On the design of reliable Boolean circuits that contain partially unreliable gates
type: Item
instance of: scholarly article
title: On the design of reliable Boolean circuits that contain partially unreliable gates
zbMATH Open document ID: 0897.68042
author: Yuan Ma
author: Daniel J. Kleitman
author: Tom Leighton
published in: Journal of Computer and System Sciences
publication date: 1998-08-04T00:00:00Z
Mathematics Subject Classification ID: 68Q05
Mathematics Subject Classification ID: 94C10
zbMATH DE Number: 1140552
zbMATH Keywords: short-circuit model of gate failure
MaRDI profile type: Publication
full work available at URL: jcss.1997.1531
OpenAlex ID: W1984072326
cites work: Fault Tolerant Sorting Networks
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cites work: Invariance of complexity measures for networks with unreliable gates
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DOI: 10.1006/JCSS.1997.1531
description: scientific article; zbMATH DE number 1140552