Mathematical models of the Twin-T, Wien-bridge and family of minimum component electronic chaos generators with demonstrative recurrence plots
The authors propose a mathematical model for chaos generators, described in their previous publications. They use a two segment piecewise-linear model for the junction field effect transistor current-voltage characteristics. Numerical simulations of the models confirm their validity leading to results identical to those observed experimentally.
scientific article; zbMATH DE number 1532749