A Bayesian semiparametric regression model for reliability data using effective age
type: Item
instance of: scholarly article
title: A Bayesian semiparametric regression model for reliability data using effective age
zbMATH Open document ID: 1506.62108
author: Li Li
author: Timothy E. Hanson
published in: Computational Statistics and Data Analysis
publication date: 2018-11-23T00:00:00Z
Mathematics Subject Classification ID: 62-08
Mathematics Subject Classification ID: 62G08
Mathematics Subject Classification ID: 62F15
Mathematics Subject Classification ID: 62G05
Mathematics Subject Classification ID: 62N05
zbMATH DE Number: 6983921
zbMATH Keywords: effective age
zbMATH Keywords: repairable system
zbMATH Keywords: tailfree process
zbMATH Keywords: truncated data
Wikidata QID: Q57963081
MaRDI profile type: Publication
full work available at URL: j.csda.2013.11.015
OpenAlex ID: W2052642427
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DOI: 10.1016/J.CSDA.2013.11.015
description: scientific article; zbMATH DE number 6983921