Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution
type: Item
instance of: scholarly article
title: Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution
zbMATH Open document ID: 1428.62460
author: Tian-Qun Xu
author: Yue-Peng Chen
published in: Applied Mathematical Modelling
publication date: 2018-12-07T00:00:00Z
Mathematics Subject Classification ID: 62N05
Mathematics Subject Classification ID: 62F15
zbMATH DE Number: 6990708
zbMATH Keywords: zero-failure data
zbMATH Keywords: failure rate
zbMATH Keywords: two-sided M-Bayesian credible limit
zbMATH Keywords: reliability
zbMATH Keywords: exponential distribution
MaRDI profile type: Publication
full work available at URL: j.apm.2013.10.054
OpenAlex ID: W4237382587
cites work: Q5658973
cites work: E-Bayesian estimation and hierarchical Bayesian estimation of failure rate
cites work: Two-Sided M-Bayesian Credible Limits Method of Reliability Parameters and Its Applications
cites work: The M-Bayesian Credible Limits of the Reliability Derived from Binomial Distribution
cites work: Statistical decision theory and Bayesian analysis. 2nd ed
cites work: Q3327567
DOI: 10.1016/J.APM.2013.10.054
description: scientific article; zbMATH DE number 6990708