A direct impedance tomography algorithm for locating small inhomogeneities
type: Item
instance of: scholarly article
title: A direct impedance tomography algorithm for locating small inhomogeneities
zbMATH Open document ID: 1016.65079
author: Martin Brühl
author: Martin Hanke
author: Michael S. Vogelius
published in: Numerische Mathematik
publication date: 2003-03-27T00:00:00Z
review text: The authors propose a direct algorithm for determining the positions of small conductivity inhomogeneities inside an otherwise known conductor. The algorithm makes use of asymptotic expansion of the voltage potentials. The viability of this direct approach is documented by numerical examples.
Mathematics Subject Classification ID: 65N21
Mathematics Subject Classification ID: 35C20
Mathematics Subject Classification ID: 35R30
Mathematics Subject Classification ID: 35Q60
Mathematics Subject Classification ID: 78A55
zbMATH DE Number: 1889290
zbMATH Keywords: inverse problems
zbMATH Keywords: asymptotic analysis
zbMATH Keywords: reconstruction algorithm
zbMATH Keywords: impedance tomography algorithm
zbMATH Keywords: direct algorithm
zbMATH Keywords: conductor
zbMATH Keywords: asymptotic expansion
zbMATH Keywords: numerical examples
reviewed by: Karel Najzar
MaRDI profile type: Publication
full work available at URL: s002110200409
OpenAlex ID: W2136356671
DOI: 10.1007/S002110200409
description: scientific article; zbMATH DE number 1889290