Conditions for the coincidence of the TFR, TRV and CE models
type: Item
instance of: scholarly article
title: Conditions for the coincidence of the TFR, TRV and CE models
zbMATH Open document ID: 1048.62097
DOI: 10.1007/BF02777579
author: Heliang Fei
author: Rong-Hua Wang
published in: Statistical Papers
publication date: 2004-11-05T00:00:00Z
Mathematics Subject Classification ID: 62N05
zbMATH DE Number: 2113931
MaRDI profile type: Publication
cites work: A tampered failure rate model for step-stress accelerated life test
cites work: Bayesian estimation and optimal designs in partially accelerated life testing
cites work: Multiple step-stress accelerated life test: the tampered failure rate model
cites work: Accelerated Life Testing - Step-Stress Models and Data Analyses
cites work: Accelerated Testing
cites work: Equivalence of the tampered random variable and the tampered failure rate models in accelerated lifetesting for a class of life distributions having the ‘setting the clock back to zero property'
cites work: Coincidence of two failure rate models
full work available at URL: https://doi.org/10.1007/bf02777579
OpenAlex ID: W2066424277
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description: scientific article; zbMATH DE number 2113931