Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films
type: Item
instance of: scholarly article
title: Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films
zbMATH Open document ID: 1258.74072
author: W. D. Nothwang
author: John D. Clayton
author: P. W. Chung
author: Michael Grinfeld
published in: Mechanics Research Communications
publication date: 2013-03-05T00:00:00Z
Mathematics Subject Classification ID: 74F15
Mathematics Subject Classification ID: 74K35
zbMATH DE Number: 6141278
zbMATH Keywords: electromechanics
zbMATH Keywords: dielectric
zbMATH Keywords: diffusion
zbMATH Keywords: vacancies
zbMATH Keywords: thin films
MaRDI profile type: Publication
full work available at URL: j.mechrescom.2007.08.002
OpenAlex ID: W2071873242
cites work: Q5828977
cites work: Q4844100
cites work: Q3235736
DOI: 10.1016/J.MECHRESCOM.2007.08.002
description: scientific article; zbMATH DE number 6141278