Bayesian reliability modeling for masked system lifetime data
type: Item
instance of: scholarly article
title: Bayesian reliability modeling for masked system lifetime data
zbMATH Open document ID: 0968.62072
DOI: 10.1016/S0167-7152(99)00160-1
author: Tae Young Yang
author: Lynn Kuo
published in: Statistics \& Probability Letters
publication date: 2001-09-17T00:00:00Z
Mathematics Subject Classification ID: 62N05
Mathematics Subject Classification ID: 62F15
Mathematics Subject Classification ID: 62N02
zbMATH DE Number: 1445646
zbMATH Keywords: competing risks
zbMATH Keywords: Gibbs sampling
zbMATH Keywords: incomplete data
zbMATH Keywords: latent variable model
MaRDI profile type: Publication
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description: scientific article; zbMATH DE number 1445646