Reliability analysis for devices subject to competing failure processes based on chance theory
type: Item
instance of: scholarly article
title: Reliability analysis for devices subject to competing failure processes based on chance theory
zbMATH Open document ID: 1481.60188
author: Baoliang Liu
author: Yanqing Wen
author: Zhi-Qiang Zhang
published in: Applied Mathematical Modelling
publication date: 2020-04-07T00:00:00Z
Mathematics Subject Classification ID: 60K10
Mathematics Subject Classification ID: 60G55
Mathematics Subject Classification ID: 90B25
Mathematics Subject Classification ID: 90C70
zbMATH DE Number: 7187237
zbMATH Keywords: competing failure processes
zbMATH Keywords: shock models
zbMATH Keywords: uncertainty theory
zbMATH Keywords: uncertain variable
zbMATH Keywords: uncertain distribution
MaRDI profile type: Publication
full work available at URL: j.apm.2019.05.036
OpenAlex ID: W2947513710
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Wikidata QID: Q127820044
DOI: 10.1016/J.APM.2019.05.036
description: scientific article; zbMATH DE number 7187237