Design of optimal Bayesian reliability test plans for a parallel system based on type-II censoring
type: Item
instance of: scholarly article
title: Design of optimal Bayesian reliability test plans for a parallel system based on type-II censoring
zbMATH Open document ID: 1499.62361
DOI: 10.1007/978-981-15-8061-1_39
author: Yanyan Li
publication date: 2021-08-31T00:00:00Z
Mathematics Subject Classification ID: 62N05
Mathematics Subject Classification ID: 62F15
Mathematics Subject Classification ID: 90B25
zbMATH DE Number: 7389006
zbMATH Keywords: reliability
zbMATH Keywords: life testing
zbMATH Keywords: type-II censoring
zbMATH Keywords: type-I error
zbMATH Keywords: type-II error
MaRDI profile type: Publication
full work available at URL: 978-981-15-8061-1 39
OpenAlex ID: W3113157562
description: scientific article; zbMATH DE number 7389006