New insights into error accumulation due to biased particle distribution in semi-implicit particle methods
type: Item
instance of: scholarly article
title: New insights into error accumulation due to biased particle distribution in semi-implicit particle methods
author: Guangtao Duan
author: Takuya Matsunaga
author: Seiichi Koshizuka
author: A. Yamaguchi
author: Mikio Sakai
published in: Computer Methods in Applied Mechanics and Engineering
publication date: 2021-12-13T00:00:00Z
Mathematics Subject Classification ID: 76M28
Mathematics Subject Classification ID: 65M75
zbMATH DE Number: 7442789
zbMATH Keywords: MPS method
zbMATH Keywords: free surface
zbMATH Keywords: high order schemes
zbMATH Keywords: error accumulation
zbMATH Keywords: stability
zbMATH Keywords: biased particle distribution
MaRDI profile type: Publication
full work available at URL: j.cma.2021.114219
OpenAlex ID: W3211153200
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DOI: 10.1016/J.CMA.2021.114219
description: scientific article; zbMATH DE number 7442789