Finding ambiguity groups in low testability analog circuits
type: Item
instance of: scholarly article
title: Finding ambiguity groups in low testability analog circuits
zbMATH Open document ID: 1001.94524
DOI: 10.1109/81.873868
author: Jing Pang
author: Stefano Manetti
author: Maria Cristina Piccirilli
author: Giulio Fedi
author: Janusz A. Starzyk
publication date: 2002-12-15T00:00:00Z
Mathematics Subject Classification ID: 94C12
Mathematics Subject Classification ID: 65F30
zbMATH DE Number: 1616160
zbMATH Keywords: analog system testing
zbMATH Keywords: ambiguity groups
zbMATH Keywords: analog fault diagnosis
zbMATH Keywords: QR factorization
describes a project that uses: Matlab
MaRDI profile type: Publication
OpenAlex ID: W2148720062
published in: IEEE Transactions on Circuits and Systems. I: Fundamental Theory and Applications
description: scientific article; zbMATH DE number 1616160