Determination of parameters of thin semiconductor layers on the basis of one-dimensional microwave photon crystals
type: Item
instance of: scholarly article
title: Determination of parameters of thin semiconductor layers on the basis of one-dimensional microwave photon crystals
zbMATH Open document ID: 1274.78028
DOI: 10.1134/S1028335812040040
publication date: 2013-07-03T00:00:00Z
Mathematics Subject Classification ID: 78A40
Mathematics Subject Classification ID: 82D37
zbMATH DE Number: 6183611
zbMATH Keywords: semiconductor
zbMATH Keywords: photon crystal
zbMATH Keywords: waveguide
zbMATH Keywords: refraction coefficient
zbMATH Keywords: residual function
Wikidata QID: Q57670869
MaRDI profile type: Publication
full work available at URL: s1028335812040040
OpenAlex ID: W2000250845
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published in: Doklady Akademii Nauk
author: Yu. V. Gulyaev
author: S. A. Nikitov
author: D. A. Usanov
author: A. V. Skripal'
author: A. E. Postel'ga
author: D. V. Ponomarev
review text: Numerical calculations were performed to study the parameters of the electromagnetic wave propagation through a multilayer-filled photon crystal waveguide.
description: scientific article; zbMATH DE number 6183611