Designing a Degradation Test with a Two-Parameter Exponential Lifetime Distribution
type: Item
instance of: scholarly article
title: Designing a Degradation Test with a Two-Parameter Exponential Lifetime Distribution
zbMATH Open document ID: 1466.62407
DOI: 10.1080/03610918.2013.815769
author: Hong-Fwu Yu
author: Chien-Yu Peng
publication date: 2014-08-18T00:00:00Z
Mathematics Subject Classification ID: 62N05
zbMATH DE Number: 6330986
zbMATH Keywords: degradation test
zbMATH Keywords: failure-free life
zbMATH Keywords: highly reliable product
zbMATH Keywords: two-parameter exponential distribution
MaRDI profile type: Publication
full work available at URL: https://doi.org/10.1080/03610918.2013.815769
OpenAlex ID: W2024851753
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published in: Communications in Statistics. Simulation and Computation
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description: scientific article; zbMATH DE number 6330986