Learning acyclic probabilistic circuits using test paths
type: Item
instance of: scholarly article
zbMATH Open document ID: 1235.68126
author: Dana Angluin
author: James Aspnes
author: Jiang Chen
author: David Eisenstat
author: Lev Reyzin
publication date: 2012-04-17T00:00:00Z
full work available at URL: angluin09a.html
Mathematics Subject Classification ID: 68T05
zbMATH DE Number: 6025095
zbMATH Keywords: nonadaptive learning algorithms
zbMATH Keywords: probabilistic circuits
zbMATH Keywords: causal Bayesian networks
zbMATH Keywords: value injection queries
zbMATH Keywords: test paths
MaRDI profile type: Publication
title: Learning acyclic probabilistic circuits using test paths
published in: Journal of Machine Learning Research (JMLR)
description: scientific article; zbMATH DE number 6025095