On Confidence Intervals for Process Capability Indices in a One-Way Random Model
type: Item
instance of: scholarly article
title: On Confidence Intervals for Process Capability Indices in a One-Way Random Model
zbMATH Open document ID: 1272.62148
DOI: 10.1080/03610918.2011.621569
author: K. K. Jose
author: Jane A. Luke
publication date: 2012-10-30T00:00:00Z
Mathematics Subject Classification ID: 62P30
Mathematics Subject Classification ID: 62F25
Mathematics Subject Classification ID: 62F40
zbMATH DE Number: 6100446
zbMATH Keywords: Bissell's formula
zbMATH Keywords: bootstrap calibration
zbMATH Keywords: generalized confidence interval
zbMATH Keywords: one-way random effect model
zbMATH Keywords: process capability index
zbMATH Keywords: Satterthwaite's method
MaRDI profile type: Publication
full work available at URL: https://doi.org/10.1080/03610918.2011.621569
OpenAlex ID: W2022707452
cites work: How Reliable is Your Capability Index?
cites work: Bootstrap methods: another look at the jackknife
cites work: Bootstrap confidence interval estimates of cpk: an introduction
cites work: Q4717648
cites work: Generalized confidence intervals for process capability indices in the one-way random model
cites work: Q4648981
cites work: New generalization of process capability index Cpk
cites work: The \({C''}_{pk}\) index for asymmetric tolerances: Implications and inference
cites work: Q4826755
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published in: Communications in Statistics. Simulation and Computation
description: scientific article