Optimal design of hazard-free and easily testable logic networks
type: Item
instance of: scholarly article
title: Optimal design of hazard-free and easily testable logic networks
zbMATH Open document ID: 0565.94024
DOI: 10.1080/00207728508926689
author: Bidyut Gupta
author: Bhargab B. Bhattacharya
publication date: 1985-01-01T00:00:00Z
Mathematics Subject Classification ID: 94C10
Mathematics Subject Classification ID: 94C15
zbMATH DE Number: 3902558
zbMATH Keywords: fault detection
zbMATH Keywords: hazard-free combinational networks
zbMATH Keywords: control inputs
zbMATH Keywords: test set generation
zbMATH Keywords: syndrome testing
MaRDI profile type: Publication
full work available at URL: https://doi.org/10.1080/00207728508926689
OpenAlex ID: W2071172087
published in: International Journal of Systems Science. Principles and Applications of Systems and Integration
description: scientific article