BIST test pattern generators for two-pattern testing-theory and design algorithms
type: Item
instance of: scholarly article
title: BIST test pattern generators for two-pattern testing-theory and design algorithms
zbMATH Open document ID: 1055.68518
DOI: 10.1109/12.485565
author: Chih-Ang Chen
author: Sandeep K. Gupta
published in: IEEE Transactions on Computers
publication date: 1996-01-01T00:00:00Z
Mathematics Subject Classification ID: 68M15
Mathematics Subject Classification ID: 68Q80
Mathematics Subject Classification ID: 94C12
zbMATH DE Number: 1966844
zbMATH Keywords: pseudo-exhaustive testing
zbMATH Keywords: built-in self-test
MaRDI profile type: Publication
full work available at URL: https://doi.org/10.1109/12.485565
OpenAlex ID: W2088710519
description: scientific article; zbMATH DE number 1966844