Optimum simple step-stress plans using reliability estimate
type: Item
instance of: scholarly article
title: Optimum simple step-stress plans using reliability estimate
zbMATH Open document ID: 1302.62217
DOI: 10.1007/BF03321969
author: Mohammed Al-Haj Ebrahem
published in: Metron
publication date: 2014-12-03T00:00:00Z
Mathematics Subject Classification ID: 62N05
zbMATH DE Number: 6376519
zbMATH Keywords: accelerated life test
zbMATH Keywords: cumulative exposure model
zbMATH Keywords: log-logistic distribution
zbMATH Keywords: likelihood ratio test
zbMATH Keywords: maximum likelihood estimation
zbMATH Keywords: reliability
zbMATH Keywords: simple step-stress
MaRDI profile type: Publication
cites work: Optimum simple step-stress plan for log-logistic cumulative exposure model
cites work: Optimal simple step stress accelerated life test design for reliability prediction
cites work: Optimum Simple Step-Stress Plans for Accelerated Life Testing
cites work: Accelerated Life Testing - Step-Stress Models and Data Analyses
cites work: Accelerated Testing
description: scientific article; zbMATH DE number 6376519