Probabilistic modeling of fatigue damage accumulation for reliability prediction
type: Item
instance of: scholarly article
title: Probabilistic modeling of fatigue damage accumulation for reliability prediction
zbMATH Open document ID: 1233.90133
DOI: 10.1155/2011/718901
author: Vijay Rathod
author: Om Prakash Yadav
author: Rakesh K. Jain
author: Ajay Pal Singh Rathore
published in: International Journal of Quality, Statistics, and Reliability
publication date: 2012-03-13T00:00:00Z
review text: Summary: A methodology for probabilistic modeling of fatigue damage accumulation for single stress level and multistress level loading is proposed in this paper. The methodology uses linear damage accumulation model of Palmgren-Miner, a probabilistic \(S-N\) curve, and an approach for a one-to-one transformation of probability density functions to achieve the objective. The damage accumulation is modeled as a nonstationary process as both the expected damage accumulation and its variability change with time. The proposed methodology is then used for reliability prediction under single stress level and multistress level loading, utilizing dynamic statistical model of cumulative fatigue damage. The reliability prediction under both types of loading is demonstrated with examples.
Mathematics Subject Classification ID: 90B25
zbMATH DE Number: 6014424
MaRDI profile type: Publication
full work available at URL: https://doi.org/10.1155/2011/718901
OpenAlex ID: W1990495754
Wikidata QID: Q58692370
cites work: Stochastic models for fatigue damage of materials
cites work: Stochastic fatigue damage modeling under variable amplitude loading
cites work: A general model for fatigue damage due to any stress history
cites work: Q3742555
description: scientific article; zbMATH DE number 6014424