Statistical model and local binary pattern based texture feature extraction in dual-tree complex wavelet transform domain
type: Item
instance of: scholarly article
title: Statistical model and local binary pattern based texture feature extraction in dual-tree complex wavelet transform domain
zbMATH Open document ID: 1448.94040
author: Peng Yang
author: Guowei Yang
published in: Multidimensional Systems and Signal Processing
publication date: 2020-08-03T00:00:00Z
Mathematics Subject Classification ID: 94A08
Mathematics Subject Classification ID: 62H35
zbMATH DE Number: 7226925
zbMATH Keywords: texture feature extraction
zbMATH Keywords: dual-tree complex wavelet transform
zbMATH Keywords: generalized gamma density
zbMATH Keywords: local binary pattern
MaRDI profile type: Publication
full work available at URL: s11045-017-0474-z
OpenAlex ID: W2589429765
cites work: Wavelet Modeling Using Finite Mixtures of Generalized Gaussian Distributions: Application to Texture Discrimination and Retrieval
cites work: Statistical Wavelet Subband Characterization Based on Generalized Gamma Density and Its Application in Texture Retrieval
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cites work: Description of interest regions with local binary patterns
cites work: On the Method of Logarithmic Cumulants for Parametric Probability Density Function Estimation
cites work: Lightweight Probabilistic Texture Retrieval
cites work: Dominant Local Binary Patterns for Texture Classification
cites work: Q2763447
DOI: 10.1007/S11045-017-0474-Z
description: scientific article; zbMATH DE number 7226925