Imaging of multiple linear cracks using impedance data
Multiple, non-intersecting, two-dimensional, linear cracks are determined from one or two Cauchy data in electrical impedance tomography. Reconstruction asymptotic formulae are given. Complex optics potentials are used as trial test functions. Optimal input current flux data are given in terms of the Neumann kernel for the Laplace equation. The number of cracks is estimated from a singular value decomposition analysis.
scientific article; zbMATH DE number 5117693