Imaging of multiple linear cracks using impedance data
type: Item
instance of: scholarly article
title: Imaging of multiple linear cracks using impedance data
zbMATH Open document ID: 1129.78013
author: Kurt Bryan
author: Rachel Krieger
author: Nic Trainor
published in: Journal of Computational and Applied Mathematics
publication date: 2007-01-22T00:00:00Z
review text: Multiple, non-intersecting, two-dimensional, linear cracks are determined from one or two Cauchy data in electrical impedance tomography. Reconstruction asymptotic formulae are given. Complex optics potentials are used as trial test functions. Optimal input current flux data are given in terms of the Neumann kernel for the Laplace equation. The number of cracks is estimated from a singular value decomposition analysis.
Mathematics Subject Classification ID: 78A55
zbMATH DE Number: 5117693
zbMATH Keywords: inverse problem
zbMATH Keywords: cracks
zbMATH Keywords: impedance imaging
reviewed by: Daniel Lesnic
MaRDI profile type: Publication
full work available at URL: j.cam.2006.01.006
OpenAlex ID: W2123695308
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DOI: 10.1016/J.CAM.2006.01.006
description: scientific article; zbMATH DE number 5117693