Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. II: Experimental validation of the non-local stress/curvature relations
type: Item
instance of: scholarly article
title: Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. II: Experimental validation of the non-local stress/curvature relations
zbMATH Open document ID: 1331.74013
author: N. E. Zubov
published in: International Journal of Solids and Structures
publication date: 2007-03-02T00:00:00Z
Mathematics Subject Classification ID: 74A20
Mathematics Subject Classification ID: 74-05
zbMATH DE Number: 5130263
zbMATH Keywords: thin film
zbMATH Keywords: X-ray microdiffraction
zbMATH Keywords: non-local stress/curvature relations
MaRDI profile type: Publication
full work available at URL: j.ijsolstr.2006.10.015
OpenAlex ID: W2115851677
DOI: 10.1016/J.IJSOLSTR.2006.10.015
description: scientific article; zbMATH DE number 5130263