Single fault detection tests for generalized iterative switching circuits
type: Item
instance of: scholarly article
title: Single fault detection tests for generalized iterative switching circuits
zbMATH Open document ID: 1357.94112
DOI: 10.3103/S0278641915030073
published in: Moscow University Computational Mathematics and Cybernetics
publication date: 2015-10-26T00:00:00Z
Mathematics Subject Classification ID: 94C12
Mathematics Subject Classification ID: 94C10
zbMATH DE Number: 6498023
zbMATH Keywords: fault detection test
zbMATH Keywords: switching circuit
zbMATH Keywords: generalized iterative switching circuit
zbMATH Keywords: Shannon function
zbMATH Keywords: easily testable circuit
author: Dmitry S. Romanov
author: E. Yu. Romanova
MaRDI profile type: Publication
cites work: Q5849272
cites work: Q3268318
cites work: Q2968777
cites work: Q5684577
cites work: Q3342359
cites work: Q3699613
cites work: Q3033708
full work available at URL: s0278641915030073
OpenAlex ID: W1561678540
description: scientific article; zbMATH DE number 6498023