Yield analysis of partial defect tolerant bit-plane array
type: Item
instance of: scholarly article
title: Yield analysis of partial defect tolerant bit-plane array
zbMATH Open document ID: 1189.90046
publication date: 2010-06-28T00:00:00Z
Mathematics Subject Classification ID: 90B25
Mathematics Subject Classification ID: 91B30
zbMATH DE Number: 5727686
zbMATH Keywords: partial defect tolerance
zbMATH Keywords: error tolerance
zbMATH Keywords: effective yield
zbMATH Keywords: systolic arrays
author: Vladimir Ciric
author: Aleksandar S. Cvetković
author: I. Z. Milentijević
MaRDI profile type: Publication
full work available at URL: j.camwa.2009.08.068
OpenAlex ID: W2040863065
cites work: Q5421905
cites work: Q4847229
cites work: Q4190126
cites work: Q5835082
DOI: 10.1016/J.CAMWA.2009.08.068
published in: Computers & Mathematics with Applications
description: scientific article; zbMATH DE number 5727686