Pages that link to "Item:Q1208514"
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The following pages link to A parallel system for test pattern generation (Q1208514):
Displaying 6 items.
- Thread-parallel integrated test pattern generator utilizing satisfiability analysis (Q987743) (← links)
- Optimization of parallel-series self-testing for discrete devices (Q2487659) (← links)
- Test generation of the digital circuits based on the genetic algorithms (Q2720911) (← links)
- A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation (Q4384085) (← links)
- (Q5276993) (← links)
- Computational Science and Its Applications – ICCSA 2004 (Q5307202) (← links)