Pages that link to "Item:Q1414315"
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The following pages link to Identification of contact regions in semiconductor transistors by level-set methods (Q1414315):
Displaying 5 items.
- Recovery of an interface from boundary measurement in an elliptic differential equation (Q421367) (← links)
- Recovering doping profiles in semiconductor devices with the Boltzmann-Poisson model (Q543757) (← links)
- Identification of semiconductor contact resistivity (Q3991962) (← links)
- RECONSTRUCTION OF SINGULAR SURFACES BY SHAPE SENSITIVITY ANALYSIS AND LEVEL SET METHOD (Q5485727) (← links)
- Reconstruction of contact regions in semiconductor transistors using Dirichlet-Neumann cost functional approach (Q5856186) (← links)
