Pages that link to "Item:Q3131507"
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The following pages link to Algebraic method for fault diagnosis and parametric identification of analog circuits (Q3131507):
Displaying 12 items.
- A classical parameter identification method and a modern test generation algorithm (Q626403) (← links)
- An algorithm for fault location and parameter identification of analog circuits based on interval arithmetics (Q1341541) (← links)
- An algebraic diagnostic method for symmetric function circuitry (Q1882094) (← links)
- Minimization of ambiguity in parametric fault diagnosis of analog circuits: a complex network approach (Q2249038) (← links)
- Parametric fault diagnosis of analog circuits based on a semi-supervised algorithm (Q2311025) (← links)
- Finding ambiguity groups in low testability analog circuits (Q2724344) (← links)
- Fault diagnosis for analog circuits with tolerance based on circuit feature information matrix (Q2984149) (← links)
- Fault diagnosis method for analog circuits based on matrix perturbation analysis (Q3132118) (← links)
- A search algorithm for the solution of the multifrequency fault diagnosis equations (Q4198642) (← links)
- A theory and an algorithm for analog circuit fault diagnosis (Q4198658) (← links)
- A method for fault diagnosis in linear electronic circuits (Q4458665) (← links)
- Algebraic Approach to Ambiguity-Group Determination in Nonlinear Analog Circuits (Q5010974) (← links)
