Finding ambiguity groups in low testability analog circuits (Q2724344)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Finding ambiguity groups in low testability analog circuits |
scientific article; zbMATH DE number 1616160
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Finding ambiguity groups in low testability analog circuits |
scientific article; zbMATH DE number 1616160 |
Statements
Finding ambiguity groups in low testability analog circuits (English)
0 references
15 December 2002
0 references
analog system testing
0 references
ambiguity groups
0 references
analog fault diagnosis
0 references
QR factorization
0 references
