Pages that link to "Item:Q3331145"
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The following pages link to Stuck-At Fault Tests in the Presence of Undetectable Bridging Faults (Q3331145):
Displaying 5 items.
- Detection of multiple input bridging and stuck-on faults in CMOS logic circuits using current monitoring (Q757021) (← links)
- Complete test-set generation for bridging faults in combinational-logic circuits (Q1077377) (← links)
- A systematic technique for detecting and locating bridging and stuck-at faults in I/O pins of LSI/VLSI chips (Q1101089) (← links)
- A Practical Approach to Fault Simulation and Test Generation for Bridging Faults (Q3690753) (← links)
- An ATPG Method for Double Stuck-At Faults by Analyzing Propagation Paths of Single Faults (Q4956704) (← links)