The following pages link to (Q3471835):
Displaying 27 items.
- Tests of contact closure for contact circuits (Q341824) (← links)
- On diagnostic tests of contact break for contact circuits (Q783101) (← links)
- Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1'' at gate outputs (Q828193) (← links)
- Lower estimate of the length of the complete test in the basis \(\{x|y \}\) (Q891140) (← links)
- Reliability of tolerance methods of checking of complex systems (Q1102686) (← links)
- Transformation of automata for simplified checking (Q1375266) (← links)
- On fault detection tests of contact break for contact circuits (Q1741470) (← links)
- Lower bounds for the lengths of single tests for Boolean circuits (Q1741479) (← links)
- Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates (Q1798079) (← links)
- Bounds on Shannon functions of lengths of contact closure tests for contact circuits (Q2050225) (← links)
- Short tests of closures for contact circuits (Q2192016) (← links)
- Minimal complete fault detection tests for circuits of functional elements in standard basis (Q2287393) (← links)
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
- Unit checking output tests under constant faults for functional elements (Q2513254) (← links)
- Some classes of easily testable circuits in the Zhegalkin basis (Q2688833) (← links)
- Short complete diagnostic tests for circuits implementing linear Boolean functions (Q2690960) (← links)
- Estimations of the lengths of tests for logic gates in presence of many permissible faults (Q3186843) (← links)
- On Partial Covers, Reducts and Decision Rules (Q3600307) (← links)
- Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates (Q4558289) (← links)
- LOWER BOUNDS FOR LENGTHS OF COMPLETE DIAGNOSTIC TESTS FOR CIRCUITS AND INPUTS OF CIRCUITS (Q5150757) (← links)
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES (Q5151082) (← links)
- Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates (Q5151257) (← links)
- A METHOD FOR CONSTRUCTING LOGIC NETWORKS ALLOWING SHORT SINGLE DIAGNOSTIC TESTS (Q5151288) (← links)
- On the exact value of the length of the minimal single diagnostic test for a particular class of circuits (Q5374004) (← links)
- Short complete diagnostic tests for circuits with two additional inputs in some basis (Q6051966) (← links)
- Shannon function of the test length with respect to gate input identification (Q6195911) (← links)
- Short conditional complete diagnostic tests for circuits under one-type constant faults of gates (Q6548979) (← links)
