The following pages link to (Q3696841):
Displaying 10 items.
- Functional diagnosis of combinational circuits by compact testing methods (Q751633) (← links)
- Method of synthesis of easily tested circuits (Q1105569) (← links)
- Circuits over monoids: A fault model, and a trade-off between testability and circuit delay (Q1195687) (← links)
- Minimal length test vectors for multiple-fault detection (Q1826631) (← links)
- Synthesizing testable combinational circuits (Q1882093) (← links)
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
- Method of synthesis of easily testable circuits admitting single fault detection tests of constant length (Q2629840) (← links)
- Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements (Q3057821) (← links)
- Design of easily testable combinational circuits (Q4303906) (← links)
- Synthesis of easily testable circuits over the basis {&, ∨, ⁻} for systems of Boolean functions (Q4917386) (← links)
